Semiconductor

Long-term Reliability Tester

Long-term Reliability Tester

Long-term Reliability Tester

  • 530nm, 850nm Laser Diode
  • Automatic X-Y Stage
  • Temperature Control Jig
  • QE Measurement
  • Dark I-V Measurement
  • Data Report
Specifications

2948810296_AbspBurR_4aa6c25a742332670a4f16f58d7d5442fcacfba6.png

 

2948810296_pzEDWBVA_98acf3fca3196d6b1d58cbbfca47d60a40823786.png

검색 닫기
Inquiry TopTOP