TNE Tech

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Testing Equipment

TNE TECH shares concerns with customers and develops together.

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  • 3

    Photo Response Test System

    • Photo Response Test
    • Cut off Frequency, Rise/Fall Tim
    • High Luminance Lag Measurement
    • Optical Impedance
    • Modulated Light Source : Square, sine
    • 530nm, 850nm Laser Diode
    • Data Report
  • 2

    Reliability Test System

    • Multichannel Reliability Test
    • 530nm, 850nm Laser Diode
    • Automatic X-Y Stage
    • Temperature Control Jig
    • Dark I-V Measurement
    • QE Measurement
    • Data Report
  • 1

    Spectral QE Test System

    • Light Source: Xe or TH Lamp
    • Wavelength rage : 300~1,100nm (~1500nm Option) Optical Chopping : 4Hz ~ 1kHz
    • Lock-In Amp : 4Ch, 24 Bit resolution
    • Signal Swithching & IV Converter
    • Reference Device: Si, InGaAs PD

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